Our innovative substrate-free filters, high-precision and miniaturized, are created by using ion beam sputtering on a temporary substrate. The sacrificial layer's dissolution, using only water, is a cost-effective and environmentally responsible process. Our thin polymer layer filters demonstrate an elevated level of performance, in contrast to filters made in the same coating batch. These filters facilitate the production of a single-element coarse wavelength division multiplexing transmitting device for telecommunications applications. This is accomplished by interposing the filter between the fiber ends.
Zirconia thin films, produced by atomic layer deposition, experienced irradiation by 100 keV protons across a fluence range from 1.1 x 10^12 to 5.0 x 10^14 p+/cm^2. The presence of a carbon-rich layer, deposited on the optical surface as a result of proton impact, was found to indicate contamination. click here Accurate assessment of the substrate's damage was demonstrated as essential for a dependable determination of the irradiated films' optical constants. Both the buried damaged zone within the irradiated substrate and the contamination layer coating the sample surface contribute to the observed sensitivity of the ellipsometric angle. Zirconia doped with carbon, possessing an excess of oxygen, and the intricacies of its chemistry are investigated, alongside the resultant changes in refractive index of irradiated films due to shifts in the film's composition.
Compact tools are critical to offsetting dispersion during the generation and propagation of ultrashort vortex pulses (ultrashort pulses with helical wavefronts), a requirement for realizing their potential applications. This study's optimization of chirped mirrors relies on a global simulated annealing algorithm that incorporates the analysis of temporal characteristics and waveforms from femtosecond vortex pulses. Performances of the algorithm, optimized using diverse strategies and chirped mirror designs, are detailed.
From preceding investigations using stationary scatterometers and white light, we propose, to the best of our understanding, a novel white-light scattering experiment anticipated to yield superior results to the existing methodologies in almost all cases. With a broadband illumination source and a spectrometer, the setup is extremely simple, enabling the analysis of light scattering exclusively in a specific direction. The fundamental principle of the instrument elucidated, roughness spectra are obtained for multiple samples and the consistency of results is examined at the intersection of bandwidths. For samples that cannot be shifted, this technique is exceptionally practical.
This study explores how the dispersion of a complex refractive index can be used to analyze the influence of diluted hydrogen (35% H2 in Ar) on the optical properties of gasochromic materials. Consequently, a prototype material, composed of a tungsten trioxide thin film combined with a platinum catalyst, was developed using electron beam evaporation. Experimental verification showcases how the proposed method accounts for the observed fluctuations in the transparency of such materials.
A hydrothermal method is employed in this paper to synthesize a nickel oxide nanostructure (nano-NiO) with the aim of utilizing it in inverted perovskite solar cells. These pore nanostructures were applied to the ITO/nano-N i O/C H 3 N H 3 P b I 3/P C B M/A g device in order to increase the contact and channel regions between the hole transport and perovskite layers. This study aims to accomplish two things. Three distinct nano-NiO morphologies were produced via a synthesis process, each morphology cultivated at a precise temperature, specifically 140°C, 160°C, and 180°C. An annealing process at 500°C was followed by the utilization of a Raman spectrometer to evaluate phonon vibrational and magnon scattering features. click here Subsequently, the inverted solar cells were prepared for spin-coating by dispersing nano-nickel oxide powders within isopropanol. Synthesis temperatures of 140°C, 160°C, and 180°C, respectively, resulted in nano-NiO morphologies manifesting as multi-layer flakes, microspheres, and particles. The perovskite layer's coverage increased to a remarkable 839% when microsphere nano-NiO was chosen as the hole transport layer. Utilizing X-ray diffraction, the perovskite layer's grain size was evaluated, and the subsequent analysis identified strong crystallographic orientations in the (110) and (220) peaks. In spite of this, the power conversion efficiency's effect on the promotion is significant, exceeding the planar structure's poly(34-ethylenedioxythiophene) polystyrene sulfonate conversion efficiency by a factor of 137.
Optical monitoring via broadband transmittance measurements is contingent upon the precise alignment of both the substrate and the optical path, affecting the accuracy of the outcome. To enhance the precision of monitoring, we introduce a corrective procedure, unaffected by substrate characteristics like absorption or optical path misalignment. This substrate, under these circumstances, can take the form of a test glass or a product. Through experimental coatings, both with and without the correction, the algorithm's veracity is established. Also, the optical monitoring system was used for an on-site inspection of quality. All substrates undergo detailed spectral analysis, with high position resolution, by the system. Effects of plasma and temperature on a filter's central wavelength have been identified. This comprehension leads to the improvement of the subsequent experiments.
Accurate measurement of a surface's wavefront distortion (WFD) with an optical filter coating demands the operating wavelength and angle of incidence of the filter. In some cases, this isn't feasible, requiring the filter's assessment at an off-band wavelength and angle (typically at 633 nanometers and zero degrees, respectively). The sensitivity of transmitted wavefront error (TWE) and reflected wavefront error (RWE) to variations in measurement wavelength and angle suggests that an out-of-band measurement may not accurately determine the wavefront distortion (WFD). This paper demonstrates how to forecast the wavefront error (WFE) of an optical filter at a targeted wavelength and angle within its transmission band, based on WFE data from measurements at another wavelength and a different angle beyond the band. Crucially, this method employs the optical coating's theoretical phase behavior, the measured consistency in filter thickness, and the substrate's wavefront error as it changes with the angle of incidence. The RWE measured directly at a wavelength of 1050 nanometers (45) showed a reasonably good correlation with the predicted RWE derived from a measurement at 660 nanometers (0). TWE measurements, employing both LEDs and lasers, show that measuring the TWE of a narrow bandpass filter (e.g., 11 nm bandwidth at 1050 nm) with a broadband LED source can lead to the wavefront distortion being predominantly governed by the wavefront measuring system's chromatic aberration. Using a light source whose bandwidth is less than that of the filter is therefore important.
The peak power of high-power laser facilities is circumscribed by the damage that the laser inflicts upon the final optical components. Damage growth, a direct outcome of a damage site, is a significant factor that shortens the life expectancy of the component. Significant efforts have been dedicated to improving the laser-induced damage threshold in these parts. To what extent does a higher initiation threshold contribute to a reduction in the expansion of the damage phenomenon? To investigate this query, we conducted damage progression experiments on three distinct multilayer dielectric mirror configurations, each with unique damage resistance characteristics. click here Utilizing optimized designs in conjunction with classical quarter-wave structures was our strategy. Employing a spatial top-hat beam centered at 1053 nanometers in the spectral domain and possessing an 8 picosecond pulse duration, the experiments were performed in both s- and p-polarizations. Design's influence on the amelioration of damage growth thresholds and the mitigation of damage growth rates was clearly indicated by the results. The progression of damage sequences was simulated via a numerical model. The results show a pattern consistent with the experimentally observed trends. The three presented cases demonstrate that a change in mirror design, aimed at elevating the initiation threshold, can result in a diminished manifestation of damage growth.
Contaminating particles within optical thin films are a contributing factor to the formation of nodules, subsequently impacting the laser-induced damage threshold (LIDT). The research explores ion etching of substrates to reduce the negative effects produced by nanoparticles. Early investigations suggest that the application of ion etching can lead to the removal of nanoparticles from the sample's surface; however, this treatment concurrently creates textural irregularities on the substrate surface. Optical scattering loss is augmented by this texturing procedure, while LIDT measurements indicate no discernible decline in the substrate's longevity.
To augment the performance of optical systems, a superior anti-reflective coating is crucial to ensure minimal reflectance and maximal transmittance from optical surfaces. Fogging, causing light scattering, is one of the further problems that adversely affects the image quality. Therefore, complementary functional properties must be incorporated. A commercially available plasma-ion-assisted coating chamber produced the long-term stable antireflective double nanostructure, which is situated atop an antifog coating, a highly promising combination presented here. Studies confirm that the nanostructures have no effect on antifogging capabilities, enabling their use in a multitude of applications.
The passing of Professor Hugh Angus Macleod, known by his family and friends as Angus, occurred at his home in Tucson, Arizona, on April 29th, 2021. Angus, a leading figure within the field of thin film optics, leaves behind an exceptional legacy of contributions to his thin film community. This article provides an account of Angus's extensive 60-year career in the field of optics.